Used Cascade Microtech S300

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C.

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Wentworth SPM 196 Vacuum Base High Precision Probe Manipulator. X-Y-Z movement. Vacuum base.

Wentworth 001-1146 Precision Vacuum Base Probe Manipulator. X-Y-Z travel. Vacuum base.

Karl Suss Precision High Resolution Vacuum Base Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron wafer probing. Does not have tip holder, only what is in the photo.

Alessi MH-4 Vacuum Base Precision Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron probing. Micrometer adjustment of X-Y-Z axis.

WENTWORTH MP 2300 Programmable Semiautomatic 200 mm Analytical Prober. With Labmaster integrated probing environment software, user friendly Windows based.  Accommodates wafers from 3” to 8” in dia. Motorized control of Mitutoyo microscope, long working distance objectives, camera with flat panel display. X-Y stage resolution of 0.1 micron and a repeatability of ±1.5 micron. Two  CAP-3000 programmable probe manipulator
with X-Y-Z resolution of better than 0.10 micron. Includes Probe card holder and vibration Isolation table with optical breadboard top. 115V, 50/60Hz

WENTWORTH MP 2300 Programmable Semiautomatic 200 mm Analytical Prober. With Labmaster integrated probing environment software, user friendly Windows based.  Accommodates wafers from 3” to 8” in dia. Motorized control of Mitutoyo microscope, long working distance objectives, camera with flat panel display. X-Y stage resolution of 0.1 micron and a repeatability of ±1.5 micron. Two  CAP-3000 programmable probe manipulator
with X-Y-Z resolution of better than 0.10 micron. Includes Probe card holder and vibration Isolation table with optical breadboard top. 115V, 50/60Hz