Test and Electronics

Agilent B1500A Semiconductor Device Analyzer with Four B1511B Medium Power SMU Modules. The Keysight B1500A (Agilent) Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements and also fast high-voltage pulsing. Its familiar, Microsoft Windows® user interface supports Agilent’s EasyEXPERT software, which provides a new, more intuitive task-oriented approach
to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Keysight B1500A (Agilent) can be used for a wide range of semiconductor device characterization needs (IC-CAP supports the B1500A). It is also an excellent solution for non-volatile memory cell characterization and high-speed device characterization (including advanced NBTI measurement). Features and benefi ts of the Keysight B1500A (Agilent) include: Superior IV measurement performance: 0.1 fA / 0.5 µV measurement resolution. Measurement
features include single and multi-channel sweep, time sampling, list sweep, quasi-static CV (using the SMUs), direct control and arbitrary linear waveform generation (ALWG) GUI for the HV-SPGUs. CE Marked.

Agilent E4980A 710 030 Precision LCR Meter 20 Hz to 300Khz. The E4980A precision LCR meter provides the best combination of accuracy, speed, and versatility for a wide range of component measurements. Offering fast measurement speed and outstanding performance at both low and high impedance ranges, the E4980A is the ultimate tool for general R&D and manufacturing test of components and materials. LAN, USB and GPIB PC connectivity enhances your design and test productivity. 115V, 50/60Hz

Anritsu MA2444D 10 MHz to 40 GHz (-67 to 20 dBm) Power Sensor

Burleigh Exfo WA7100 Multi Wavelength Meter 1270 to 1680 nm.

• Wavelength Range: 1270 to 1680 nm
• Wavelength Absolute Accuracy: ± 1.5 pm
• Max Input level: + 18 dBm
• Optical Input: 9/125 um Single-Mode fiber 

• Display Resolution: 0.001 nm
• Linearity: ± 0.3 dB

ETS Lindgren Series 5240-18 RF-Shielded Tabletop Test Enclosure. High Performance RF-Shielded Test Enclosure. Maximum Performance Double Electrically Isolated (DEI) RF Door with Toggle Action Over Center Draw Latches with Single Action Uni-Handle. 24oz. Copper Table Model Enclosure Nominal OD:   (450 x 450 x 450mm) 18" x 18" x18" OD. Magnetic Field: 120 dB @ 1MHz to 30 MHz. Electric Field: 120 dB from 1 MHz to 30 MHz. Plane Wave: 120 dB @ 30 MHz to 1 GHz. Microwave: 100 dB @ 1 GHz to 10 GHz

HP 8562E Spectrum Analyzer. Continuous 30 Hz to 13.2 GHz sweeps. Resolution bandwidths: 1 Hz to 100 Hz. Low phase noise and wide dynamic range. Precision time base and 1 Hz counter resolution. Adjacent channel power, channel power, carrier power and gated video measurements. Includes 85620A mass memory module. Calibrated & Certified at additional price.

HP 70902A IF Section Module. 10 Hz to 300 kHz.

HP 70903A IF Section Module. 100 kHZ to 3 MHz.

HP 70100A Power Meter Module. 100 kHz to 50 GHz.

HP 70100A Power Meter Module. 100 kHz to 50 GHz.