Used Karl Suss Probe

Karl Suss Prober Dark Box Enclosure. Light tight enclosure for wafer probers. Cable ports for maintaining darkness while running cables into box. Inside Dimensions.: 32 in. L x 29 in. W x 36 in. H.

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates and shields the chuck from external environment. This eliminates electromagnetic and electrostatic interference. You make measurements inside an integral, low noise, shielded and light-tight chamber. Whatever the application DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000 series probe stations assure best in the world measurements. Sturdy optics bridge mount with 8” x 5” travel for analytical microscope. Azoom microscope with single long working distance objective. Includes vibration isolation table built just for this type of prober.  200mm thermal chuck with Temptronic temperature controller and a temperature range of -65°C to +200°C.  Easy to use graphical user interface guides you through prober tasks. X-Y stage resolution 0.1 micron with an accuracy of +/- 2 micron. Capable of handling up to eight vacuum mount, magnetic-mount or fixed mount positioners. Safely load and unload DUTs with easy access and locking roll out stage.

Cascade Microtech Probe Card Holder. Probe card holder for the Summit and the S300 Cascade wafer probers.

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Wentworth SPM 196 Vacuum Base High Precision Probe Manipulator. X-Y-Z movement. Vacuum base.

Wentworth 001-1146 Precision Vacuum Base Probe Manipulator. X-Y-Z travel. Vacuum base.

Alessi MH-4 Vacuum Base Precision Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron probing. Micrometer adjustment of X-Y-Z axis.