Used Wentworth SPM 196

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Cascade Microtech RF Microwave East-West Magnetic Base Probe Manipulator. Precision probe manipulator for RF or microwave testing. Micrometer adjustment of X-Y and Z axis. Provides ultra precise control needed for submicron wafer probing. Magnetic base.

Wentworth 001-1146 Precision Vacuum Base Probe Manipulator. X-Y-Z travel. Vacuum base.

Karl Suss Precision High Resolution Vacuum Base Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron wafer probing. Does not have tip holder, only what is in the photo.

Micromanipulator 450 Vacuum Base Precision Probe Micropositioner. Used for micropositioning of test pin on a wafer prober.

Cascade Microtech REL-6100 200mm Manual Submicron Analytical Wafer Prober. Parametric probe station combines precision sub-micron probing capability with superior measurement performance necessary for DC/CV analysis. Manual movement of X-Y stage. Excellent stability for probing wafers up to 200mm. Power assisted tilt back microscope and platen lift handle. 8-inch dia. vacuum chuck with 203mm x 203mm X-Y travel and a resolution of 0.2 µm. Platen accepts magnetic or vacuum base probe manipulators and has a  vertical travel of 50.8mm and a resolution of 1 µm. Mitutoyo microscope with two long working distance objectives. Heavy duty microscope bridge.

Alessi MH-4 Vacuum Base Precision Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron probing. Micrometer adjustment of X-Y-Z axis.