Used Wentworth SPM 196

Wentworth 034-4002 Probe Contact Box.

Integrated Technology Corp. PB500A Probe Card Repair and Analysis Station. Computer controlled system fully tests and exercise the probe card and allows complete statistical monitoring of probe card performance. Planarization, current leakage and resistance testing. Full database kept on each probe card for statistical process control.

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Signatone CM400 Automated Analytical Probe Station. Not complete, sold as is for parts.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Wentworth SPV195 Precision Vacuum Base Probe Manipulator.

Wentworth SPV195 Precision Vacuum Base Probe Manipulator.

Karl Suss Prober Dark Box Enclosure. Light tight enclosure for wafer probers. Cable ports for maintaining darkness while running cables into box. Inside Dimensions: 32 in. L x 29 in. W x 36 in. H.

Signatone S-250 - 6 inch Precision Manual Analytical Prober. Makes probing sub-micron lines easy. Linear platen lift, a fast action coarse lift picks the probes up evenly and returns them to the same point with micron repeatability. Bausch and Lomb MicroZoom microscope with two long working distance objectives and a 1 in. x 1 in. X-Y stage movement. 6-inch dia. vacuum chuck with 6 in. x 6 in. X-Y movement. Platen accepts vacuum or magnetic base probes.