Inventory Number: |
64892 |
Category: |
Wafer Analysis |
Manufacturer: |
Filmetrics |
Filmetrics F20 Advanced Thin Film Measurement System. Thickness, refractive index and extinction coefficient are measured quickly and easily with the F20 advanced spectrometry system. Spectral analysis of reflections from the top and bottom of the thin-film provides thickness and optical constants (n and k) in seconds. Measurement Range: Thickness 100Å to 50 µm, Optical Constants 1000Å to 10 µm. Thickness Accuracy: +/- 1 nm at 500 nm thickness. Precision: 0.1 nm. Repeatability: 0.07 nm. 110V, 50/60Hz
Retail (USD): $8,250.00
Now (USD): $8,250.00