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Wafer Analysis

Used Nanometrics 8300X

Inventory Number: 59620
Now (USD): $19,000.00

Nanometrics 8300X Thin Film Metrology Tool. Unit gives robot error when powered up. Can accommodate 300mm wafers. Film thickness measurement system. Sold As Is.

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Used Semilab WT-2000PVN

Inventory Number: 62628
Now (USD): $29,000.00

Semilab WT-2000PVN Multifunction Wafer Mapping Tool. Tabletop measurement system capable of performing a variety of measurements on PV cells, wafers and blocks. Configuration: Standard µ-PCD measurements. Max. 200 mm (8 in.) sample diameter on stage, manual loading. Wintau operating and evaluation software. Test: Minority lifetime accuracy and repeatability measurements on Semilab’s µ-PCD test sample. Diffusion length, internal quantum efficiency and reflectance accuracy and repeatability measurement on Semilab’s LBIC test sample. Test Wafers: 6-inch bare, polished, n-type wafer for µ-PCD test. (Id. V1020_035).

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Used JA Woollam Nanometric 8300 Ellipsometer

Inventory Number: 63985
Now (USD): $2,500.00

JA WOOLLAM ELLIPSOMETER PARTS FROM A NANOMETRICS 8300 SYSTEM. Just what is in the photos.

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Used Veeco DEKTAK 150

Inventory Number: 64292
Now (USD): $21,000.00

Veeco Dektak 150 High Performance Surface Profiler Contact stylus profiler. Large standard Z range of 1 millimeter enables larger step measurements. Accommodates samples up to 90 millimeters thick, performs long scans of 55 millimeters. Stylus Force: 1 to 15 mg. Step height repeatability. Vertical Resolution: 1Å max. 100-240V, 50/60 Hz, CE

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