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Wafer Analysis

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Used Semilab WT-2000PVN

Inventory Number: 62628
Now (USD): $29,000.00

Semilab WT-2000PVN Multifunction Wafer Mapping Tool. Tabletop measurement system capable of performing a variety of measurements on PV cells, wafers and blocks. Configuration: Standard µ-PCD measurements. Max. 200 mm (8 in.) sample diameter on stage, manual loading. Wintau operating and evaluation software. Test: Minority lifetime accuracy and repeatability measurements on Semilab’s µ-PCD test sample. Diffusion length, internal quantum efficiency and reflectance accuracy and repeatability measurement on Semilab’s LBIC test sample. Test Wafers: 6-inch bare, polished, n-type wafer for µ-PCD test. (Id. V1020_035).

Product Details

Used Filmetrics F10-RT 205-0863

Inventory Number: 64569
Now (USD): $12,950.00

Filmetrics F10-RT Thin Film Analyzer NEW IN THE BOX. Model 205-0863. Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications. TheF10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating time-consuming changes in hardware configuration. Data capture is fast – the array-based spectrometers typically take less than a second. Instantly reports minimum and maximum reflectance and transmittance values in user-configurablewavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. Software Version 9.3.1.0, Customer must supply their own computer. Includes Filmetrics standards-Thickness standard, Dark, and 3 Reflectance standards. Units purchased new in 2019 and never used. Still in the box.

Product Details

Used Filmetrics F10-RT

Inventory Number: 64570
Now (USD): $12,950.00

Filmetrics F10-RT Thin Film Analyzer NEW IN THE BOX. Model 205-0863. Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications. TheF10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating time-consuming changes in hardware configuration. Data capture is fast – the array-based spectrometers typically take less than a second. Instantly reports minimum and maximum reflectance and transmittance values in user-configurablewavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. Software Version 9.3.1.0, Customer must supply their own computer. Includes Filmetrics standards-Thickness standard, Dark, and 3 Reflectance standards. Units purchased new in 2019 and never used. Still in the box.

Product Details

Used Filmetrics F10-RT

Inventory Number: 64571
Now (USD): $12,950.00

Filmetrics F10-RT Thin Film Analyzer NEW IN THE BOX. Model 205-0863. Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications. The F10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating time-consuming changes in hardware configuration. Data capture is fast – the array-based spectrometers typically take less than a second. Instantly reports minimum and maximum reflectance and transmittance values in user-configurablewavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. Software Version 9.3.1.0, Customer must supply their own computer. Includes Filmetrics standards-Thickness standard, Dark, and 3 Reflectance standards. Units purchased new in 2019 and never used. Still in the box.

Product Details