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Wafer Analysis

Used August Technology NSX-85

Inventory Number: 57564
Now (USD): $45,000.00

Automated Defect Inspection System. Inspection of whole wafers, sawn wafers, JEDEC trays, Auer boats, die in gel/waffle paks, MCM’s. Detects defects down to 0.5 micron. Automated wafer mapping and identification. Automated data collection and reporting. Menu-based, easy to use Windows environment. 200-240V, 1 Ph, 50/60 Hz, 5A, CE.

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Used CDE Resmap 178

Inventory Number: 55143
Now (USD): Contact for Price

THIS UNIT IS SOLD. WE WOULD LIKE TO BUY YOUR CDE SYSTEMS. PLEASE CONTACT US IF YOU HAVE SYSTEMS TO SELL. * * * * * * * * * * * * * * * * * * * * * * * * * * Four Point Probe Resistivity Measurement System. Four point probe system for mapping resistivity on substrates from 2 in. to 8 in. dia. Manual loading of subtrates. Measurement Range: 2 milliohms/sq. to 5 megaohms/sq. Polar maps, rectangular maps, line scan or user defined patterns. 115/230V, 60 Hz.

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Used CDE Resmap 273

Inventory Number: 62246
Now (USD): $35,000.00

Large Substrate Resistivity Mapping System. Designed to meet the needs of 300 mm process development and large substrate film characterization. Can handle wafers from 2 in. to 12 in. dia. and square substrates up to 8.6 in. x 8.6 in. Polar maps, rectangular maps, line scan or user defined scans. 120V, 60 Hz, CE.

Product Details

Used Cyberoptics Cyberscan 200

Inventory Number: 50584
Now (USD): $4,950.00

Non-Contact Profile Measurement System. Uses laser triangulation to analyze two dimensional data. Non-contact measurement allows you to work with wet and fragile samples. PC controller analyzes data. Motorized stage. 120V, 60 Hz.

Product Details

Used Daini Seikosha SFT/156

Inventory Number: 34297
Now (USD): $250.00

Fluorescent X-Ray Measurement System. X-Y Stage: 3 in. x 3 in. Travel Z. Adjustment: 1.3 in. Min. Measurement area: .005 in. Sold AS IS.

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Used Gaertner L2W16D.830

Inventory Number: 58267
Now (USD): $950.00

Multiwavelength 200mm Ellipsometer. Has a software disk but no cables or controls. Missing computer and stage driver. Two wavelength ellipsometers use additional laser sources to analyze difficult films. 8 in. dia. stage with motorized stage, no controller. Sold As Is with 30 day ROR.

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Used Gaertner L-26

Inventory Number: 58135
Now (USD): $950.00

Simple Manual Ellipsometer. Manual stage. Missing computer. Reliable HeNe laser source. Small 15 micron measuring spot. 115V, 50/60 Hz.

Product Details

Used JMAR S2610-01

Inventory Number: 50626
Now (USD): $6,000.00

Non-Contact Automatic 3-Axis Tabletop Measurement System. JMAR Video CMM® software. Supports high magnification microscope optics. Three channel computer controlled light source. X-Y stage travel: 10 in. x 4 in. 115V, 60 Hz. Mfg. 2001.

Product Details

Used KLA Tencor P-6

Inventory Number: 62308
Now (USD): $12,000.00

SOLD AS IS. UNIT DOES NOT HAVE A PC. PARTS NOT WORKING.

Surface Profiler. Unit does not have a PC. The P-6 surface profiler features an unprecedented range of features and capabilities in a mid-range general purpose instrument. A variety of options are available to enhance the capabilities of the standard system. Stylus Profiling: The precision scan stage design enables high quality scans over the entire 6 in. sample stage area with up to 150 mm scan length and 1 mm Z range. This design ensures the highest quality 2D scans resulting in a higher level of metrology quality. Step Height Repeatability: A step height repeatability of 6 angstrom or 0.1 percent (1s ), a noise floor below 1nm RMS as measured on the scan stage, and a sub-Angstrom resolution capacitance sensor translates into the most repeatable, and sensitive ultra-thin film step measurements,roughness/waviness measurements and accurate curvature reproduction. Parts not working.

Product Details

Used Kruss FM40 EasyDrop

Inventory Number: 62365
Now (USD): $8,500.00

Contact Angle Measuring System. Computer controlled dosing. Regulable illumination. Digital image allows perfect drop shape analysis. Accuracy: +/- 0.1 degrees. 100-240V, 47-63 Hz, CE.

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