Wafer Analysis

Nanometrics 8300X Thin Film Metrology Tool. Unit gives robot error when powered up. Can accommodate 300mm wafers. Film thickness measurement system. Sold As Is.

Semilab WT-2000PVN Multifunction Wafer Mapping Tool. Tabletop measurement system capable of performing a variety of measurements on PV cells, wafers and blocks. Configuration: Standard µ-PCD measurements. Max. 200 mm (8 in.) sample diameter on stage, manual loading. Wintau operating and evaluation software. Test: Minority lifetime accuracy and repeatability measurements on Semilab’s µ-PCD test sample. Diffusion length, internal quantum efficiency and reflectance accuracy and repeatability measurement on Semilab’s LBIC test sample. Test Wafers: 6-inch bare, polished, n-type wafer for µ-PCD test. (Id. V1020_035).

JA WOOLLAM ELLIPSOMETER PARTS FROM A NANOMETRICS 8300 SYSTEM. Just what is in the photos.

Veeco Dektak 150 High Performance Surface Profiler Contact stylus profiler. Large standard Z range of 1 millimeter enables larger step measurements. Accommodates samples up to 90 millimeters thick, performs long scans of 55 millimeters. Stylus Force: 1 to 15 mg. Step height repeatability. Vertical Resolution: 1Å max. 100-240V, 50/60 Hz, CE