Cascade Microtech

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Cascade Microtech Summit 9000 Analytical Probe Station The Summit 9000 uses a flexible, modular design to accommodate the full range of Cascade microwave and digital microprobing tools. Square 6” x 6” wafer stage. Independent stage vacuum permits an impedance standard substrate, a constant substrate and a test wafer to be carried simultaneously. X-Y stage transition and linear Z-lift.

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C.

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. Part Number SQ-S300-862-01. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C.

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates and shields the chuck from external environment. This eliminates electromagnetic and electrostatic interference. You make measurements inside an integral, low noise, shielded and light-tight chamber. Whatever the application DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000 series probe stations assure best in the world measurements. Sturdy optics bridge mount with 8” x 5” travel for analytical microscope. Azoom microscope with single long working distance objective. Includes vibration isolation table built just for this type of prober.  200mm thermal chuck with Temptronic temperature controller and a temperature range of -65°C to +200°C.  Easy to use graphical user interface guides you through prober tasks. X-Y stage resolution 0.1 micron with an accuracy of +/- 2 micron. Capable of handling up to eight vacuum mount, magnetic-mount or fixed mount positioners. Safely load and unload DUTs with easy access and locking roll out stage.

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. Part Number SQ-S300-862-01. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C. 12" Wafer Prober.

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C.

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates and shields the chuck from external environment. This eliminates electromagnetic and electrostatic interference. You make measurements inside an integral, low noise, shielded and light-tight chamber. Whatever the application DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000 series probe stations assure best in the world measurements. Sturdy optics bridge mount with 8” x 5” travel for analytical microscope. Azoom microscope with single long working distance objective. Includes vibration isolation table built just for this type of prober.  200mm thermal chuck with Temptronic temperature controller and a temperature range of -65°C to +200°C.  Easy to use graphical user interface guides you through prober tasks. X-Y stage resolution 0.1 micron with an accuracy of +/- 2 micron. Capable of handling up to eight vacuum mount, magnetic-mount or fixed mount positioners. Safely load and unload DUTs with easy access and locking roll out stage.

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C.

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C.