Cascade Microtech

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Cascade Microtech Summit 9000 Manual Precision Analytical Probe Station. Modular design to accommodate the full range of Cascade Microtech microwave and digital probing tools. Square 6 in. x 6 in. vacuum chuck. Ample platen mounting surface for DC needle probes and other accessories. Linear Z lift. Roll out stage for fast loading. Stereo microscope.

Cascade Microtech REL-6100 Semiautomatic Probe Station with 200mm Heated Chuck. The REL-6100 Series Parametric Probe Station combines precision sub-micron probing capability with the superior measurement performance necessary for DC/CV analysis. The stations feature sub-micron resolution, precise motion control and 8-inch travel. High precision stage for internal die probing. Manual and motorized override of all programmable functions under closed-loop continuous tracking conditions. Extremely useful for fast probe tip replacement in programmable and CAD navigation environments. Self-evident movement control with manual knobs, joystick, or mouse.

Cascade Microtech DCM 210 Vacuum Base Precision Probe Micropositioner with Picoprobe Power Supply. Features .5 in. X,Y and Z axis adjustment range. Vacuum base. Includes power supply.

Cascade Microtech 1200 Probe Card Holder. Low profile probe card holder for Summit Stations with MicroChamber. Support for 4.5 in. rectangular probe cards up to 11.357 in. L.

Cascade Microtech 12000 200mm Semiautomatic Analytical Probe Station with MicroChamber and Heated Chuck. MicroChamber™ isolates and shields the chuck from external environment. This eliminates electromagnetic and electrostatic interference. You make measurements inside an integral, low noise, shielded and light-tight chamber. Sturdy optics bridge mount with 8 in. x 5 in. travel for analytical microscope. Mitutoyo microscope with single long working distance objective. Vibration isolation table built just for this type of prober. 200mm thermal chuck with Temptronic TPO3010B-2300-1 temperature controller and a temperature range of 0 to +200 deg C. Easy to use graphical user interface guide you through prober tasks. X-Y stage resolution 0.1 micron with an accuracy of +/- 2 micron. Handles up to eight vacuum mount, magnetic-mount or fixed mount positioners. Safely load and unload DUTs with easy access and locking roll out stage.

Cascade Microtech MH2 Vacuum Base Probe Manipulator. Precision probe manipulator for precision placement of test pin on a wafer prober. Provides 3 Axis of linear motion.

Cascade Microtech REL-4800 200mm Manual Submicron Wafer Prober. The REL-4800 parametric probe station combines precision sub-micron probing capability with superior measurement performance necessary for DC/CV analysis. Manual movement of X-Y stage. Excellent stability for probing wafers up to 200mm. Power assisted tilt back microscope and platen lift handle. 8-inch dia. vacuum chuck with 203mm x 203mm X-Y travel and a resolution of 0.2 micrometers. Platen accepts magnetic or vacuum base probe manipulators and has a vertical travel of 50.8mm and a resolution of 1 micrometer. Mitutoyo microscope with three long working distance objectives. Heavy duty microscope bridge. CE marked.

Cascade Microtech REL-6100 200mm Manual Submicron Analytical Wafer Prober. Parametric probe station combines precision sub-micron probing capability with superior measurement performance necessary for DC/CV analysis. Manual movement of X-Y stage. Excellent stability for probing wafers up to 200mm. Power assisted tilt back microscope and platen lift handle. 8-inch dia. vacuum chuck with 203mm x 203mm X-Y travel and a resolution of 0.2 µm. Platen accepts magnetic or vacuum base probe manipulators and has avertical travel of 50.8mm and a resolution of 1 µm. Mitutoyo microscope with two long working distance objectives. Heavy duty microscope bridge.

Cascade Microtech RF-1 Precision Manual Microwave Prober. The RF-1 combines precision movement and stability with microwave probing features. Precision 150mm (6 in.) X-Y stage. 1-inch adjustable Z-chuck height. 150mm microwave chuck holds impedance standard substrates and wafer at the same time to allow quick calibrate and measure steps. Switch selectable vacuum zones. High rigidity microwave platen with precision linear lift. Fast, precise movement between test sties with orthogonal X-Y stage translation and linear Z lift.