Cascade Microtech

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Cascade Microtech RF Microwave East-West Magnetic Base Probe Manipulator. Precision probe manipulator for RF or microwave testing. Micrometer adjustment of X-Y and Z axis. Provides ultra precise control needed for submicron wafer probing. Magnetic base.

Cascade Microtech REL-6100 200mm Manual Submicron Analytical Wafer Prober. Parametric probe station combines precision sub-micron probing capability with superior measurement performance necessary for DC/CV analysis. Manual movement of X-Y stage. Excellent stability for probing wafers up to 200mm. Power assisted tilt back microscope and platen lift handle. 8-inch dia. vacuum chuck with 203mm x 203mm X-Y travel and a resolution of 0.2 µm. Platen accepts magnetic or vacuum base probe manipulators and has a  vertical travel of 50.8mm and a resolution of 1 µm. Mitutoyo microscope with two long working distance objectives. Heavy duty microscope bridge.

Cascade Microtech Summit 11000 High Precision 200mm Manual Wafer Probe Station with Microchamber
Roll out wafer stage for safe easy wafer loading. 200mm wafer chuck with selectable vacuum ports for easy transition to different wafer sizes. Z-lift range: 5.5mm linear lift with repeatability: 0

Cascade Microtech DCM 200 Vacuum Base Precision Probe Micropositioner Features .5” X,Y and Z axis adjustment range. Micron placement accuracy.
Vacuum base. Quantity of 3 Available

Cascade Microtech Summit 9000 Analytical Probe Station The Summit 9000 uses a flexible, modular design to accommodate the full range of Cascade microwave and digital microprobing tools. Square 6” x 6” wafer stage. Independent stage vacuum permits an impedance standard substrate, a constant substrate and a test wafer to be carried simultaneously. X-Y stage transition and linear Z-lift.

 Cascade Microtech MPS150 A1J Precision Analytical Prober.  Highly-precise manual probe system for wafers and substrates up to 150 mm. It supports a wide variety of applications such as C-V/I-V, RF, mm-Wave and sub-THz measurements, device and wafer characterization tests (DWC), failure analysis (FA), submicron probing, MEMS, optoelectronic engineering tests and more. Its stable platen is designed to accommodate up to sixteen positioners, providing a function similar to a probe card for special wafer-level reliability (WLR) applications. Includes Industrial Precision microscope with three Mitutoyo long working distance objectives 2x, 10x, 20x and 10x eyepieces. Also included are two Cascade Microtech DPP210 precision probe manipulators with magnetic bases.