Inventory Number: |
64890 |
Category: |
Wafer Analysis |
Manufacturer: |
Bruker |
Bruker Dektak XT Precision Stylus Profiler. Bruker’s DektakXT™ Stylus Profiler features a revolutionary design that enables 4 angstrom repeatability. Unmatched performance. 4 angstrom repeatability delivers industry leading accuracy. Single-arch design provides breakthrough scan stability. Leading-edge smart electronics establish new low noise benchmark. New hardware configuration offers 40% faster data collection times than prior generations. Unprecedented efficiency and ease of use. Intuitive Vision64™ user interface workflow simplifies operation. Self-aligning styli enables effortless tip exchange. Single sensor design offers low force and extended range in a single platform. Measurement Technique: Stylus profilometry (contact measurement). Measurement Capability: Two-dimensional surface profile measurements. Sample Viewing: Digital magnification, 0.275 to 2.2 mm vertical FOV. Sample X/Y Stage: Manual Stage. Max. Sample Thickness: 50 mm (1.95 in.). Step Height Repeatability: 4Å, 1 sigma on steps ≤1 μm (30 scans using a 12.5 μm stylus). Vertical Range: 1 mm (0.039 in.). Vertical Resolution: 1Å (at 6.55 μm range). 115V, 50/60Hz, 3.2A
Retail (USD): $29,000.00
Now (USD): $29,000.00