Equipment Photos

Equipment Details

Inventory Number: 59724
Category: Probers
Manufacturer: Wentworth

Wentworth SPV195 Precision Vacuum Base Probe Manipulator.

Now (USD): $650.00

Products Similar to: Wentworth SPV195

Used Wentworth SPV195

Inventory Number: 59722
Now (USD): $650.00

Wentworth SPV195 Precision Vacuum Base Probe Manipulator.

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Used Wentworth SPV195

Inventory Number: 59723
Now (USD): $650.00

Wentworth SPV195 Precision Vacuum Base Probe Manipulator.

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Used Wentworth 034-4002

Inventory Number: 48801
Now (USD): $450.00

Wentworth 034-4002 Probe Contact Box.

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Used Integrated Technology Corp. PB500A

Inventory Number: 50143
Now (USD): $6,500.00

Integrated Technology Corp. PB500A Probe Card Repair and Analysis Station. Computer controlled system fully tests and exercise the probe card and allows complete statistical monitoring of probe card performance. Planarization, current leakage and resistance testing. Full database kept on each probe card for statistical process control.

Product Details

Used Cascade Microtech FPD-100

Inventory Number: 56790
Now (USD): $250.00

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Product Details

Used Signatone CM400

Inventory Number: 58293
Now (USD): $1,500.00

Signatone CM400 Automated Analytical Probe Station. Not complete, sold as is for parts.

Product Details

Used Wentworth MP-2000

Inventory Number: 58353
Now (USD): $2,950.00

Wentworth MP-2000 200mm Programmable Analytical Prober. Being sold AS IS since we do not have the computer or software to test this. Was able to check theta rotation, platform up and down and microscope up and down. No microscope with system. 8 in. dia. vacuum chuck.

Product Details

Used MPI LEDA-8F 3G Plus-V 110

Inventory Number: 58957
Now (USD): $15,000.00

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Product Details

Used Wentworth 0-001-1096

Inventory Number: 48735
Now (USD): $950.00

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

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Used TMC Table and Dark Box

Inventory Number: 59481
Now (USD): $2,950.00

TMC Vibration Isolation Table with Dark Box. Table Dimensions: 44 in. L x 33 in. W x 32 in. H. Box Outside Dimensions: 48 in. L x 37 in. W x 36 in. H. Pneumatic isolation legs.

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