Used Signatone S-M90

Signatone S-M90 4 Axis RF/Microwave Micropositioner Probe. The S-M90 Micropositioner has been specifically engineered for the unique demands of high-frequency testing, rather than just modified from an existing DC design. Extended length ball and race bearings, captive leadscrews, and increased mass insure non-resonant performance to W-Band and beyond. Switchable magnetic base utilizes a neodymium rare-earth magnet, there is no loss of high-frequency performance due to the magnetic bond. This extends non-resonant performance to beyond 110 GHZ. Travel range, X,Y,Z: 1", 40 turns per inch. Planarization Range +- 7.5°. X,Y,Z Resolution 2 micron.

Signatone S-M90 4 Axis RF/Microwave Micropositioner Probe. The S-M90 Micropositioner has been specifically engineered for the unique demands of high-frequency testing, rather than just modified from an existing DC design. Extended length ball and race bearings, captive leadscrews, and increased mass insure non-resonant performance to W-Band and beyond. Switchable magnetic base utilizes a neodymium rare-earth magnet, there is no loss of high-frequency performance due to the magnetic bond. This extends non-resonant performance to beyond 110 GHZ. Travel range, X,Y,Z: 1", 40 turns per inch. Planarization Range +- 7.5°. X,Y,Z Resolution 2 micron.

Signatone S-M90 4 Axis RF/Microwave Micropositioner Probe. The S-M90 Micropositioner has been specifically engineered for the unique demands of high-frequency testing, rather than just modified from an existing DC design. Extended length ball and race bearings, captive leadscrews, and increased mass insure non-resonant performance to W-Band and beyond. Switchable magnetic base utilizes a neodymium rare-earth magnet, there is no loss of high-frequency performance due to the magnetic bond. This extends non-resonant performance to beyond 110 GHZ. Travel range, X,Y,Z: 1", 40 turns per inch. Planarization Range +- 7.5°. X,Y,Z Resolution 2 micron.

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Wentworth SPM 196 Vacuum Base High Precision Probe Manipulator. X-Y-Z movement. Vacuum base.

Wentworth 001-1146 Precision Vacuum Base Probe Manipulator. X-Y-Z travel. Vacuum base.

Karl Suss Precision High Resolution Vacuum Base Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron wafer probing. Does not have tip holder, only what is in the photo.

Micromanipulator 450 Vacuum Base Precision Probe Micropositioner. Used for micropositioning of test pin on a wafer prober.