Used Cascade Microtech REL-6100

Semiautomatic Probe Station with 200mm Heated Chuck. The REL-6100 Series Parametric Probe Station combines precision sub-micron probing capability with the superior measurement performance necessary for DC/CV analysis. The stations feature sub-micron resolution, precise motion control and 8-inch travel. High precision stage for internal die probing. Manual and motorized override of all programmable functions under closed-loop continuous tracking conditions. Extremely useful for fast probe tip replacement in programmable and CAD navigation environments. Self-evident movement control with manual knobs, joystick, or mouse.

Probe Contact Box.

Probe Card Repair and Analysis Station. Computer controlled system fully tests and exercise the probe card and allows complete statistical monitoring of probe card performance. Planarization, current leakage and resistance testing. Full database kept on each probe card for statistical process control.

Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Automated Analytical Probe Station. Not complete, sold as is for parts.

200mm Programmable Analytical Prober. Being sold AS IS since we do not have the computer or software to test this. Was able to check theta rotation, platform up and down and microscope up and down. No microscope with system. 8 in. dia. vacuum chuck.

3G Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Vibration isolation table with dark box. Table Dimensions: 44 in. L x 33 in. W x 32 in. H. Box Outside Dimensions: 48 in. L x 37 in. W x 36 in. H. Pneumatic isolation legs.

Magnetic Base Probe Manipulator. Micropositioner for use on wafer prober.