Used Cascade Microtech REL-6100

Cascade Microtech REL-6100 Semiautomatic Probe Station with 200mm Heated Chuck. The REL-6100 Series Parametric Probe Station combines precision sub-micron probing capability with the superior measurement performance necessary for DC/CV analysis. The stations feature sub-micron resolution, precise motion control and 8-inch travel. High precision stage for internal die probing. Manual and motorized override of all programmable functions under closed-loop continuous tracking conditions. Extremely useful for fast probe tip replacement in programmable and CAD navigation environments. Self-evident movement control with manual knobs, joystick, or mouse.

Alessi REL-6100 Manual 8” Precision Prober without Microscope. 8-inch dia. chuck with manual X-Y and Theta movement. Platen lift arm, with air assist. Microscope bridge but does not come with a microscope.

Cascade Microtech REL-6100 Manual 200mm Prober without Microscope. Precision prober can operate X-Y-Z axis manually. Precision sub-micron probing capability. Platen accepts vacuum or magnetic base probe manipulators. 8-inch dia. wafer chuck with 203mm x 203mm X-Y travel and a resolution of 0.2µm. No microscope.

Wentworth 034-4002 Probe Contact Box.

Integrated Technology Corp. PB500A Probe Card Repair and Analysis Station. Computer controlled system fully tests and exercise the probe card and allows complete statistical monitoring of probe card performance. Planarization, current leakage and resistance testing. Full database kept on each probe card for statistical process control.

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Signatone CM400 Automated Analytical Probe Station. Not complete, sold as is for parts.

Wentworth MP-2000 200mm Programmable Analytical Prober. Being sold AS IS since we do not have the computer or software to test this. Was able to check theta rotation, platform up and down and microscope up and down. No microscope with system. 8 in. dia. vacuum chuck.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.