Equipment Photos

Equipment Details

Inventory Number: 62605
Category: Probers
Manufacturer: Alessi

Alessi REL-4500 150mm Manual Analytical Prober. Vacuum Chuck: 6 in. dia. (150mm). Manual XY stage movement: 6 in. X x 6 in. Y. Platen accepts vacuum or magnetic base probe manipulators. Bausch and Lomb microscope with Bausch and Lomb objectives Industrial 2.25X and Industrial 8X. Manual quick lift platen.

Now (USD): $8,500.00

Products Similar to: Alessi REL-4500

Used Cascade Microtech FPD-100

Inventory Number: 56790
Now (USD): $250.00

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Product Details

Used MPI LEDA-8F 3G Plus-V 110

Inventory Number: 58957
Now (USD): $15,000.00

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Product Details

Used Wentworth 0-001-1096

Inventory Number: 48735
Now (USD): $950.00

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Product Details

Used Karl Suss Prober Dark Box

Inventory Number: 59919
Now (USD): $3,950.00

Karl Suss Prober Dark Box Enclosure. Light tight enclosure for wafer probers. Cable ports for maintaining darkness while running cables into box. Inside Dimensions: 32 in. L x 29 in. W x 36 in. H.

Product Details

Used Cascade Microtech Probe

Inventory Number: 62934
Now (USD): $1,950.00

Cascade Microtech RF Microwave East-West Magnetic Base Probe Manipulator. Precision probe manipulator for RF or microwave testing. Micrometer adjustment of X-Y and Z axis. Provides ultra precise control needed for submicron wafer probing. Magnetic base.

Product Details

Used Wentworth SPM 196

Inventory Number: 62937
Now (USD): $950.00

Wentworth SPM 196 Vacuum Base High Precision Probe Manipulator. X-Y-Z movement. Vacuum base.

Product Details

Used Wentworth 001-1146

Inventory Number: 62938
Now (USD): $950.00

Wentworth 001-1146 Precision Vacuum Base Probe Manipulator. X-Y-Z travel. Vacuum base.

Product Details

Used Micromanipulator 6000

Inventory Number: 63249
Now (USD): $4,500.00

Micromanipulator 6000 High Resolution Manual Wafer Prober. With the 4” (100mm) high resolution stage the Model 6000 provides the precision needed for engineering analysis and the efficient utility needed for production testing. Bausch and Lomb MicroZoom microscope with two long working distance objectives. Microscope X-Y adjustment. Linear platen fast lift with three locking up positions to lift the probes quickly for sample or location changes. Platen accepts vacuum or magnetic base probe manipulators. Needs illuminator, not on unit.

Product Details

Used Karl Suss Probe

Inventory Number: 61414
Now (USD): $950.00

Karl Suss Precision High Resolution Vacuum Base Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron wafer probing. Does not have tip holder, only what is in the photo.

Product Details

Used Micromanipulator 450

Inventory Number: 59531
Now (USD): $750.00

Micromanipulator 450 Vacuum Base Precision Probe Micropositioner. Used for micropositioning of test pin on a wafer prober.

Product Details