Equipment Photos

Equipment Details

Inventory Number: 62518
Category: Probers
Manufacturer: Karl Suss

150mm Precision Manual Analytical Prober. The PM8 provides the stability and resolution required for precise probe positioning. Manual submicron semiconductor failure analysis and in-process testing probe station. Submicron precision and stability with a fine-glide chuck stage and 6 in. x 6 in. X-Y movement. As fast as a motorized stage but with the simplicity and resolution of a manual system. Vacuum Chuck: 6 in. dia. Mitutoyo high magnification microscope with two long working distance objectives. Microscope lifts for easier access to the probes and device under test. Platen accepts vacuum base probe manipulators only.

Now (USD): $12,000.00

Products Similar to: Karl Suss PM8

Used Karl Suss PM8

Inventory Number: 62519
Now (USD): $15,000.00

200mm Precision Manual Analytical Prober. The PM8 provides the stability and resolution required for precise probe positioning. Manual submicron semiconductor failure analysis and in-process testing probe station. Submicron precision and stability with a fine-glide chuck stage and 8 in. x 8 in. X-Y movement. As fast as a motorized stage but with the simplicity and resolution of a manual system. Vacuum Chuck: 8 in. dia. Mitutoyo high magnification microscope with two long working distance objectives. Microscope lifts for easier access to the probes and device under test. Platen accepts vacuum base probe manipulators only.

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Inventory Number: 50143
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Inventory Number: 56790
Now (USD): $250.00

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Inventory Number: 58293
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Inventory Number: 58353
Now (USD): $2,950.00

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Product Details

Used MPI LEDA-8F 3G Plus-V 110

Inventory Number: 58957
Now (USD): $17,500.00

3G Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

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Inventory Number: 59481
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Inventory Number: 59605
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