Used Karl Suss PA200

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Wentworth SPM 196 Vacuum Base High Precision Probe Manipulator. X-Y-Z movement. Vacuum base.

Wentworth 001-1146 Precision Vacuum Base Probe Manipulator. X-Y-Z travel. Vacuum base.

Karl Suss Precision High Resolution Vacuum Base Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron wafer probing. Does not have tip holder, only what is in the photo.

Alessi MH-4 Vacuum Base Precision Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron probing. Micrometer adjustment of X-Y-Z axis.

WENTWORTH MP 2300 Programmable Semiautomatic 200 mm Analytical Prober. With Labmaster integrated probing environment software, user friendly Windows based.  Accommodates wafers from 3” to 8” in dia. Motorized control of Mitutoyo microscope, long working distance objectives, camera with flat panel display. X-Y stage resolution of 0.1 micron and a repeatability of ±1.5 micron. Two  CAP-3000 programmable probe manipulator
with X-Y-Z resolution of better than 0.10 micron. Includes Probe card holder and vibration Isolation table with optical breadboard top. 115V, 50/60Hz

WENTWORTH MP 2300 Programmable Semiautomatic 200 mm Analytical Prober. With Labmaster integrated probing environment software, user friendly Windows based.  Accommodates wafers from 3” to 8” in dia. Motorized control of Mitutoyo microscope, long working distance objectives, camera with flat panel display. X-Y stage resolution of 0.1 micron and a repeatability of ±1.5 micron. Two  CAP-3000 programmable probe manipulator
with X-Y-Z resolution of better than 0.10 micron. Includes Probe card holder and vibration Isolation table with optical breadboard top. 115V, 50/60Hz

Signatone S-1160MW-D6 Manual 6" Analytical Wafer Prober. Manual Probe System designed for reliable and accurate analytical testing of DC, CV-IV, and High-Power applications. Ease of use, single-handed X-Y Stage knobs for quick movement plus fine knob control. Quick platen lift with adjustable platen separation. Chuck fine rotation and lock. Steel platen accepts DC/HP/CAPPositioners (magnetic or vacuum mount). Mitutoyo Microscope with three long working distance objectives, 2x, 10x, 20x and 10x eyepieces. Vacuum chuck for 6" wafers and a spot for a reference sample.