Used JA Woollam Nanometric 8300 Ellipsometer

Nanometrics 8300X Thin Film Metrology Tool. Unit gives robot error when powered up. Can accommodate 300mm wafers. Film thickness measurement system. Sold As Is.

Semilab WT-2000PVN Multifunction Wafer Mapping Tool. Tabletop measurement system capable of performing a variety of measurements on PV cells, wafers and blocks. Configuration: Standard µ-PCD measurements. Max. 200 mm (8 in.) sample diameter on stage, manual loading. Wintau operating and evaluation software. Test: Minority lifetime accuracy and repeatability measurements on Semilab’s µ-PCD test sample. Diffusion length, internal quantum efficiency and reflectance accuracy and repeatability measurement on Semilab’s LBIC test sample. Test Wafers: 6-inch bare, polished, n-type wafer for µ-PCD test. (Id. V1020_035).

Veeco Dektak 150 High Performance Surface Profiler Contact stylus profiler. Large standard Z range of 1 millimeter enables larger step measurements. Accommodates samples up to 90 millimeters thick, performs long scans of 55 millimeters. Stylus Force: 1 to 15 mg. Step height repeatability. Vertical Resolution: 1Å max. 100-240V, 50/60 Hz, CE