Used Micromanipulator 450

Tridak 450 Precision Fluid Dispensing Controller. Controller only no valves. Used in production assembly lines and as automatic product filing equipment. 115V, 60 Hz.

Micromanipulator 450PM-A Manual Analytical Probe Station. 6” dia. chuck with 8” x 8” X-Y movement. Manual lead screw control of stage. Manual chuck theta rotation. StereoZoom microscope on boom allows manual X-Y positioning. Includes two vacuum base precision probe manipulators. Platen is non magnetic. Platen lift arm for probe separation. Also includes probe card holder.

Cascade Microtech FPD-100 Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Wentworth 0-001-1096 Vacuum Base Probe Manipulator. Micrometer on X-Y axis.

Cascade Microtech RF Microwave East-West Magnetic Base Probe Manipulator. Precision probe manipulator for RF or microwave testing. Micrometer adjustment of X-Y and Z axis. Provides ultra precise control needed for submicron wafer probing. Magnetic base.

Wentworth SPM 196 Vacuum Base High Precision Probe Manipulator. X-Y-Z movement. Vacuum base.

Wentworth 001-1146 Precision Vacuum Base Probe Manipulator. X-Y-Z travel. Vacuum base.

Micromanipulator 6000 High Resolution Manual Wafer Prober. With the 4” (100mm) high resolution stage the Model 6000 provides the precision needed for engineering analysis and the efficient utility needed for production testing. Bausch and Lomb MicroZoom microscope with two long working distance objectives. Microscope X-Y adjustment. Linear platen fast lift with three locking up positions to lift the probes quickly for sample or location changes. Platen accepts vacuum or magnetic base probe manipulators. Needs illuminator, not on unit.

Karl Suss Precision High Resolution Vacuum Base Probe Manipulator. High resolution micropositioner provides ultra precise control needed for submicron wafer probing. Does not have tip holder, only what is in the photo.