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Equipment Details

Inventory Number: 62774
Category: Wafer Analysis
Manufacturer: Nanometrics

Tabletop Thin Film Analysis System. Film thickness measurement system that utilizes a modern small spot spectroscopic reflectometer that is built on a simple to use tabletop platform. The rugged, solid state linear diode array provides fast, precise measurements of single-layer films such as oxide, nitride and photoresist, as well as the top layer on film stacks of up to 3 layers in the thickness range of 250 angstrom to 35 micrometers. Simple and easy for the user to configure measurement programs and recipes for both simple and advanced measurement applications. Data management features include a database, statistical analysis, histograms and the ability to export data files.

Now (USD): $19,500.00

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Product Details

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