Used Princeton Applied Research 263A

Plasma Monitor with Jarrell Ash Spectrometer and a 1454 Detector. The most sensitive 1451 system detector is the Model 1454a 512-channel intensified diode array providing detection levels of approximately 100 photons per A/D count. The wavelength response of the 1454 is limited by the intensifier to the range of 365 nm to 800 nm.

Spectrum Analyzer. Frequency Range:10 kHz - 1.5 GHz. Frequency Span:100 Hz - 1.5 GHz. Amplitude Range: -115 dbm to + 30 dbm. HPIB Programmable. Not Calibrated.

pA Meter/Voltage Source. Consists of an extremely stable picoampere meter and 2 programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. 3 basic semiconductor measurements: I, I-V and quasi-static C-V. Basic accuracy: 0.5 percent. High resolution: 0.001 x 10-12. HP-IB standard.

DC Source Monitor. High speed measurements down to the pA range. High accuracy and resolution: V: +/-100mV–+/-100V, 0.1 percent; l:+/- 50fA–+/-100mA, 0.3 percent. The 4141B DC Source/Monitor is designed for use as a system component in user-designed semiconductor l-V or DC parametric test systems.

Optical Time Domain Reflectometer with MH937A 1.3 mm unit. Features: Small, lightweight, Long-distance measurement with 1-meter resolution, Three-point optical masking, Easy operation, Memory for measurement setup, Built-in thermal printer

Power Supply. 32VDC, 10A, 100W. System Supply.

Power Supply. 10VDC, 25A CV/CC/M

Power Supply. 10VDC, 40A CV/CC/M.

Power Supply. 10VDC, 90A, 208VAC input. CV/CC/M

Power Supply. 20VDC, 30A, 208VAC input, CV/CC/M.