Equipment Photos

Equipment Details

Inventory Number: 62700
Category: Probers
Manufacturer: Cascade Microtech

Probe Card Holder. Low profile probe card holder for Summit Stations with MicroChamber. Support for 4.5 in. rectangular probe cards up to 11.357 in. L.

Now (USD): $2,500.00

Products Similar to: Cascade Microtech 1200

Used Anhui BEQ BTF-1200C

Inventory Number: 60680
Now (USD): $3,500.00

The BTF-1200C split tube furnace uses resistance coil wire as its heating element. The furnace is built with AI2O3 fiber materials controlled by high temperature controller with an accuracy of +/-1 deg C and 40 programmable segments up to 1200 deg C. Tube dimensions are 4 in. x 17 in. Electrical requirements: 220V, 1 Ph.

Product Details

Used Spellman SLM3P1200

Inventory Number: 61349
Now (USD): $950.00

High Voltage Supply Module. The SLM is fully arc and short protected. Excellent regulation specifications are provided along with outstanding stability performance. Typical Applications: Capacitor Charging, HiPot Testing, CRT Testing, Electrostatics, E Beam Systems and CW Lasers. 1200 watt unit, 3 kVolts, 400 mA.  3 Available.

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Used Cascade Microtech 12000

Inventory Number: 62701
Now (USD): $62,500.00

200mm Semiautomatic Analytical Probe Station with MicroChamber and Heated Chuck. MicroChamber™ isolates and shields the chuck from external environment. This eliminates electromagnetic and electrostatic interference. You make measurements inside an integral, low noise, shielded and light-tight chamber. Sturdy optics bridge mount with 8 in. x 5 in. travel for analytical microscope. Mitutoyo microscope with single long working distance objective. Vibration isolation table built just for this type of prober. 200mm thermal chuck with Temptronic TPO3010B-2300-1 temperature controller and a temperature range of 0 to +200 deg C. Easy to use graphical user interface guide you through prober tasks. X-Y stage resolution 0.1 micron with an accuracy of +/- 2 micron. Handles up to eight vacuum mount, magnetic-mount or fixed mount positioners. Safely load and unload DUTs with easy access and locking roll out stage.

Product Details

Used Cascade Microtech 12000

Inventory Number: 63040
Now (USD): $45,000.00

8-inch Semiautomatic Analytical Probe Station. You make measurements inside an integral, low noise, shielded and light-tight microchamber. The Summit 12000 Series assures access to the full measurement range offered by todays top test instrumentation. Easy to use graphical user interface guides you through testing tasks. 8-inch dia. chuck with 203mm x 203mm travel with a resolution of 0.1 micron and an accuracy of less than or equal to +/- 2 micron. 115/230V, 50/60 Hz, 4/2A, CE.

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Used Wentworth 034-4002

Inventory Number: 48801
Now (USD): $450.00

Probe Contact Box.

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Inventory Number: 50143
Now (USD): $6,500.00

Probe Card Repair and Analysis Station. Computer controlled system fully tests and exercise the probe card and allows complete statistical monitoring of probe card performance. Planarization, current leakage and resistance testing. Full database kept on each probe card for statistical process control.

Product Details

Used Cascade Microtech FPD-100

Inventory Number: 56790
Now (USD): $250.00

Vacuum Based Dual Probe Holder. These tools are for mounting two of the Cascade DCM 200 manipulators together on vacuum base for easy mounting and removal. $250 each.

Product Details

Used Signatone CM400

Inventory Number: 58293
Now (USD): $1,500.00

Automated Analytical Probe Station. Not complete, sold as is for parts.

Product Details

Used Wentworth MP-2000

Inventory Number: 58353
Now (USD): $2,950.00

200mm Programmable Analytical Prober. Being sold AS IS since we do not have the computer or software to test this. Was able to check theta rotation, platform up and down and microscope up and down. No microscope with system. 8 in. dia. vacuum chuck.

Product Details

Used MPI LEDA-8F 3G Plus-V 110

Inventory Number: 58957
Now (USD): $17,500.00

3G Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. This controller tested for power only, not LED testing. 110V, 50/60 Hz.

Product Details