Pressurization System for Microelectronics Gross and Fine Leak Testing Applications. For pressurization with helium or flourinert fluid. Microprocessor control. Dual chamber. Built in vacuum pump. Designed to exceed in all respects the testing parameters per Test Condition C. Method 1014.2 of MIL-STD-883B. In addition, helium bombing per Condition A. 115V, 60 Hz, 20A.