Jeol

Jeol IB-09010CP Cross Section Polisher Argon Beam Milling System.
Produces pristine cross sections of samples – hard, soft, or composites without smearing, crumbling, distorting, or contaminating them in any way. The ability to create perfect cross sections of paper, shale, yeast, latex beads, coatings, and wire bonds, or to create a mirrored surface on soft materials such as gold, polymers, ceramics, and glass has greatly enhanced research and analysis for many of our customers. The CP uses an argon beam to mill cross sections or polish virtually any material that is affi xed to the continuously rotating sample holder. The high power optical microscope allows the user to position a sample to within a few microns of the precise cross section position. During milling, the sample is rocked automatically to avoid creating beam striations on the cross sectioned surface. Due to the glancing incidence of the ion beam, argon is not implanted into the sample surface. 100-120V, 50/60Hz, 5A