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225 Willow Brook Rd. Freehold, NJ, 07728-6729 USA

Used Rudolph Equipment

Refurbished with a 30 Day Right of Return and 3-Month Warranty! (Unless sold "AS-IS" * )

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RUDOLPH, AUTO EL III - NEW ARRIVAL!! -- $8,500

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Used RUDOLPH  AUTO EL III  Ellipsometer. Displays film thickness, index, order thickness, substrate N and K on transparent films. Max. Sample Size: 6 in. x 6 in. Variable angle of incidence, manual adjust. Single Wavelength: 632.8nm. Null seeking operating principle.     Inventory#: 58784

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Rudolph, Auto El IV - NEW ARRIVAL!! -- $11,000

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Used Rudolph  Auto El IV  Multiwavelength Thin Film Measuring Ellipsometer with Motorized Scanning Stage option and Microspot option. Allows user to select wavelength between 405, 546, 633nm. Measures a wide range of samples. Direct readout of thickness and refractive index of single and multiple films or substrate N and K. Motorized scanning stage can be programmed to scan 1 to 20 points. Spot size using the 4D option: .004 in. x .012 in. 115V, 50/60 Hz.     Inventory#: 58890

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RUDOLPH, AUTO EL II Upgraded to Model III -- $6,500

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Used RUDOLPH  AUTO EL II Upgraded to Model III  Ellipsometer for Thin Film Thickness Measurement. One button operation for routine measurements. Displays thickness and refractive index. Square stage with micrometer adjustment on X-Y axis. 115V, 50/60 Hz.     Inventory#: 57814

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RUDOLPH, AUTO EL III -- $8,500

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Used RUDOLPH  AUTO EL III  Ellipsometer. Displays film thickness, index, order thickness, substrate N and K on transparent films. Max. Sample Size: 6 in. x 6 in. Variable angle of incidence, manual adjust. Single Wavelength: 632.8nm. Null seeking operating principle.     Inventory#: 56962

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RUDOLPH, AUTO EL III-2 -- $8,500

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Used RUDOLPH  AUTO EL III-2  Ellipsometer. Displays film thickness, index, order thickness, substrate N and K on transparent films. Max. Sample Size: 6 in. x 6 in. Variable angle of incidence, manual adjust. Single Wavelength: 632.8nm. Null seeking operating principle.     Inventory#: 57913

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RUDOLPH, AUTO EL IV -- $11,000

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Used RUDOLPH  AUTO EL IV  Multi-Wavelength Ellipsometer. Direct readout of thickness and refractive index of single and multi-layer films. NIR-3 optics allows user to select 405nm, 633nm and 830nm. The longer wavelength option is ideal for plasma deposited films so they are rendered transparent. Microspot option to reduce spot size. 115V, 50/60 Hz.     Inventory#: 55810

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