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Scanning Electron Microscopes
Used Scanning Electron Microscopes


Refurbished with a 30 Day Right of Return and 3-Month Warranty! (Unless sold "AS-IS" * )

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HITACHI  S-806C -- $3,950 AS IS

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Used  HITACHI  S-806C  Wafer Inspection Field Emission SEM. Permits inspection of in-process wafers of up to 6 in. in diameter without coating or beam damage. The inspected wafers may then be returned to the process line. The cold field emission electron source assures quality images at all operating voltages. The sample stage is fully computer controlled for ease of operation and high sample throughput. Resolution: 15 nm at 1 kV. Magnification: 50X - 100,000X. Accelerating Voltage: 0.5 - 15 kV. Sample Size: 6 in. wafer (max.). Sample Stage: X/Y: 150 mm. SOLD AS IS, NO TURBO PUMP.     Inventory#: 36721

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JEOL  JSM-5400 -- $29,000

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Used  JEOL  JSM-5400  Multi-Purpose Digital SEM. Comes with EDS System at no extra cost, EDS System is not tested or guaranteed. Resolution: 4.0 nm. Accelerating Voltage: 0.5 to 30 kV. Magnification: X15 to 200,000X. For various purposes ranging from high resolution morphological observation of microscopic surfaces to elementary analysis. 100V, 1 Ph, 50/60 Hz, 25A.     Inventory#: 52701

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JEOL  JWS-7500E -- $29,000 SOLD AS IS

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Used  JEOL  JWS-7500E  In-Line Wafer Inspection SEM for up to 200 mm Wafers and 0.5 micron Design Rule.      Inventory#: 51317

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JEOL  JWS-7515 -- $75,000

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Used  JEOL  JWS-7515  In-Line Wafer Inspection Electron Microscope. Field emission electron gun. Oxford ISIS EDS detector with cryo compressor (LN2 free operation). Resolution: 8 nanometer. Magnification: 100X to 200,000X. Accelerating voltage up to 12 kV. 4 axes goniometer stage.     Inventory#: 49809

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JEOL  JWS-7515 -- $75,000

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Used  JEOL  JWS-7515  In-Line Wafer Inspection Electron Microscope. Field emission electron gun. EDS detector with cryo compressor (LN2 free operation). Resolution: 8 nm. Magnification: 100X to 200,000X. Accelerating voltage up to 12 kV. 4 axis goniometer stage.     Inventory#: 52702

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JEOL  JWS-7555 -- $99,000

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Used  JEOL  JWS-7555  Wafer Inspection SEM. Cassette to robot handling. Magnification to 200,000. Specimen Stage: 4 axis goniometer with 200 mm X-Y travel and tilt -15 to 60 degrees. Field emission electron gun. Date of Mfg.: 1999. CE marked.     Inventory#: 52567

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JEOL  JWS-7555 -- $49,000 AS IS

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Used  JEOL  JWS-7555  Wafer Inspection SEM with X-Ray Detector. Resolution: 5 nm. Magnification: 100X to 200,000X. Field emission electron gun. X-Y Stage Travel: 200 mm. $99,000 Refurbished.     Inventory#: 52718

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* = Warranty terms only apply to non "as-is" items. "As-Is" items will have different return and warranty conditions. Contact us for details.

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