Refurbished with a 30 Day Right of
Return and 3-Month Warranty! (Unless sold "AS-IS" * )
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Used
ALESSI
REL 6100
8 in. Semiautomatic Submicron Prober with Temperature Controlled Chuck.
8 in. dia. temperature controlled chuck, temperature range 0 to 200 deg C.
Temptronics TPO 315B temperature controller.
A-Zoom microscope with long working distance objective allows increased magnification without having to rotate to new objectives. Submicron resolution, stability and precise motion control.
Control chuck movement with the remote joystick, IEE-488 commands or Windows software.
115V, 50/60 Hz.
Inventory#:
55023
Used
CASCADE MICROTECH
12000
8 in. Semiautomatic Analytical Probe Station.
Windows based prober controls. Precise submicron chuck movements. Bausch and Lomb MicroZoom microscope with long working distance objectives. Currently configured for use with probe cards. Temptronic TPO3010B 8 in. dia. heated chuck system with a temperature range of 0 to 200 deg C. 115/230V, 50/60 Hz.
Inventory#:
53684
Used
FOUR DIMENSIONS
280C
Four Point Probe Resistivity Mapping System.
Recipe driven automatic operation.
Manual or auto modes. Accommodates wafers up to 150 mm.
Measurement Range: 10m ohms/sq. to 800k ohms/sq.
Cartesian maps, polarmaps, diameter scans.
115V, 60 Hz.
Inventory#:
53220
Used
FOUR DIMENSIONS
280C
Four Point Probe Resistivity Mapping System.
Recipe driven automatic operation.
Manual or auto modes.
Accommodates wafers up to 150 mm.
Measurement Range: 10m ohms/sq. to 800k ohms/sq.
Cartesian maps, polarmaps, diameter scans.
115V, 60 Hz.
Inventory#:
53268
Used
INTEGRATED TECHNOLOGY CORP.
PB500A
Probe Card Repair and Analysis Station.
Computer controlled system fully tests and exercise the probe card
and allows complete statistical monitoring of probe card performance.
Planarization, current leakage and resistance testing.
Full database kept on each probe card for statistical process control.
Inventory#:
50143
Used
KLA
1007
Automatic Wafer Prober.
100 wafer capacity reduces loading/unloading requirements.
The system accepts wafers from 3-6 in. in dia.
Probe Tip Polishing: Programmable probe
tip polisher uses a fused ceramic disk.
Utilities:100/115/200/220/240 VAC, 50/60 Hz., 2.2 KVA
XY Table: Standard travel 7.3 x 15.0 in.
Speed: 4.9 in./sec.
Resolution: .01 mil.
Accuracy including alignment: .5 mil.
Repeatability: +/-.1 mil.
XY index setting:.1 to 9999.9 mils.
Vertical Max. travel: 590 mils.
Adaptive range: 352-531 mils.
Programmable overdrive: 0-8 mils.
Rotational: Chuck rotation +/- degrees.
Angular resolution: .0005 degrees.
6 in. chuck.
Sold As Is.
Inventory#:
29137
Used
LINE TOOL
LENS HOLDER
Lens Holder with 1-1/2 in.-32 thread hole with 2 lock rings
plus or minus 7 degree tilt in two directions.
Inventory#:
42918
Used
MC SYSTEMS
PROBER
4 in. Wafer Prober.
4 in. dia. chuck. Platen for magnetic based probe manipulators.
Bausch & Lomb MicroZoom microscope with 2 long working distance objectives.
Inventory#:
54882
Multiple photos.. 
ALESSI
MH-2
Magnetic Base Probe Manipulator.
Inventory#:
54993
Bid-Service
LLC, 225 Willow Brook Road, POB 6729 Freehold, NJ 07728 PHONE:
732-863-9500