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Order Item Informationn |
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| Inventory Number: | 45994 |
| Manufacturer: | APPLIED MATERIALS |
| Model: | EXCITE |
| Description: | High Speed Particle Detection System for Bare Wafer or Patterned Wafer Inspection. Inspects device wafers after processing is completed or inspects blanket films. Blanket films can be inspected at over 60 wafers per hour and patterned wafers at over 45 wph. .1µm particle detection on unpatterned silicon. Windows NT operating system. Currently configured for 200mm wafers but can be configured for 300mm. Date of Mfg. 2003 |
| Price: | $49,000 |
| Product ID | 19456 |
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Please provide the following shipping information (items in RED are REQUIRED!)
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Special Instructions, comments, questions:
After we receive this form, we will enter the order, and send confirming paperwork and payment information to the email address you indicated. You will receive a copy of the order via Email once it is submitted.
If you do not receive a confirmation within two business days, please contact us.
Most systems require 2 to 6 weeks to be scheduled for testing and checkout (as-is items can be shipped immediately). If you have an emergency situation - we will try to work with you, but please mention this in the "Special Instructions" field above.
Our inventory contains thousands of items - this written order helps reduce errors and helps us avoid delays in processing your order.
Thank you for your order - we DO appreciate your business!
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